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Manipulation and soldering of carbon nanotubes using atomic force microscope

✍ Scribed by Yuta Kashiwase; Takayuki Ikeda; Takahide Oya; Toshio Ogino

Book ID
108060544
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
551 KB
Volume
254
Category
Article
ISSN
0169-4332

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Manipulation, dissection, and lithograph
Manipulation, dissection, and lithography using modified tapping mode atomic force microscope
✍ Zhiguo Liu; Zhuang Li; Gang Wei; Yonghai Song; Li Wang; Lanlan Sun πŸ“‚ Article πŸ“… 2006 πŸ› John Wiley and Sons 🌐 English βš– 311 KB

## Abstract A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip‐sample interaction can be efficiently controlled.