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Electrical cutting and nicking of carbon nanotubes using an atomic force microscope

✍ Scribed by Park, Ji-Yong; Yaish, Yuval; Brink, Markus; Rosenblatt, Sami; McEuen, Paul L.

Book ID: 120637040
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 427 KB
Volume: 80
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1485126

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