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Electrical characterization versus temperature of SI MOS transistors with plasma nitrided gate oxide

โœ Scribed by A. Emrani; G. Ghibaudo; F. Balestra; B. Piot; V. Thirion; A. Straboni


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
281 KB
Volume
22
Category
Article
ISSN
0167-9317

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