Electrical characterization of integrated circuits by scanning force microscopy
✍ Scribed by C. Böhm; C. Roths; U. Müller; A. Beyer; E. Kubalek
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 395 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0921-5107
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📜 SIMILAR VOLUMES
## Abstract A comparative study of atomic force microscopy (AFM) and scanning electron microscopy (SEM) imaging of the healthy human liver parenchyma was carried out to determine the similarities and the differences. In this study, we compared the fine hepatic structures as observed by SEM and AFM.
Metaphase chromosomes prepared according to the standard spreading procedure exhibit viscoelastical behavior after rehydration. The salt-dependency of this elasticity was investigated using contact mode scanning force microscopy (SFM). Therefore, chromosomes were imaged in solutions of different ion