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Electrical characteristics of MOS capacitors with HfTiON as gate dielectric

โœ Scribed by Weibing Chen; Jingping Xu; Puito Lai; Yanping Li; Shengguo Xu; Chulok Chan


Book ID
107403776
Publisher
Wuhan University of Technology
Year
2009
Tongue
English
Weight
707 KB
Volume
24
Category
Article
ISSN
1000-2413

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