Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures. Part-II experiment: F. Shoucair, W. Hwang and P. Jain Microelectron. Reliab. 24, 487 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 95 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80164-6