Electrical characteristics of large scale integration (LSI) Mosfet's at very high temperatures. Part I; theory: F. Shoulcair, W. Hwang and P. Jain Microelectron. Reliab. 24, 465 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 90 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80057-4