Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures. Part II: experiment : F. Shoucair, W. Hwang and P. Jain. Microelectron. Reliab.24, 487 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 129 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90133-7