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Electrical and structural properties of the YBCO superconducting-semiconducting interface

✍ Scribed by Roman Sobolewski; W. Xiong; W. Kula; B. McIntyre

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
247 KB
Volume
194-196
Category
Article
ISSN
0921-4526

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We have found the deposition technology at which the interface roughness of Nb/Si multi/a yer is strongly correlated and decreases with deposited layer number. On the basis of our Nb/Si multilayer we succeeded to prepare ten-fold stacked Josephson junction (JJ). Basic electric properties of stacked