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Structural and electrical properties of superconducting Nb/Si multilayers

✍ Scribed by I Vávra; P Lobotka; J Dérer; L.R. Wellenberg

Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
412 KB
Volume
50
Category
Article
ISSN
0042-207X

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✦ Synopsis

We have found the deposition technology at which the interface roughness of Nb/Si multi/a yer is strongly correlated and decreases with deposited layer number. On the basis of our Nb/Si multilayer we succeeded to prepare ten-fold stacked Josephson junction (JJ). Basic electric properties of stacked JJ are presented.

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