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Electrical and Reliability Characteristics of High-$\kappa~{\rm HoTiO}_{3}~\alpha$-InGaZnO Thin-Film Transistors

✍ Scribed by Pan, Tung-Ming; Chen, Ching-Hung; Liu, Jiang-Hung; Her, Jim-Long; Koyama, Keiichi

No coin nor oath required. For personal study only.

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