Effect of surface roughness on electrical characteristics in amorphous InGaZnO thin-film transistors with high-κ Sm2O3 dielectrics

✍ Scribed by Chen, Fa-Hsyang; Hung, Meng-Ning; Yang, Jui-Fu; Kuo, Shou-Yi; Her, Jim-Long; Matsuda, Yasuhiro H.; Pan, Tung-Ming

• Book ID: 120353245
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 688 KB
• Volume: 74
• Category: Article
• ISSN: 0022-3697
• DOI: 10.1016/j.jpcs.2012.12.006