✦ LIBER ✦

Electrical and optical characterization of defect levels caused in InGaAs by boron ion implantation

✍ Scribed by Shin'ichi Yamamura; Tadamasa Kimura; Shigemi Yugo; Riichiro Saito; Michio Murata; Takeshi Kamiya

No coin nor oath required. For personal study only.

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