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Electric field effect on the thermal emission of traps in semiconductor junctions

✍ Scribed by Vincent, G.; Chantre, A.; Bois, D.

Book ID: 118138846
Publisher: American Institute of Physics
Year: 1979
Tongue: English
Weight: 484 KB
Volume: 50
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.326601

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