Electric field and temperature dependence of the stress induced leakage current: Fowler–Nordheim or Schottky emission?

✍ Scribed by P. Riess; G. Ghibaudo; G. Pananakakis; J. Brini; G. Ghidini

• Book ID: 117149528
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 182 KB
• Volume: 245
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/s0022-3093(98)00853-9