✦ LIBER ✦
A new model for the description of gate voltage and temperature dependence of gate induced drain leakage (GIDL) in the low electric field region [DRAMs]
✍ Scribed by Rosar, M.; Leroy, B.; Schweeger, G.
- Book ID
- 114538005
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 178 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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