✦ LIBER ✦

Elastic and inelastic electron mean free paths from x-ray photoelectron diffraction experiments

✍ Scribed by H.P. Bonzel; U. Breuer; O. Knauff

Book ID: 118363621
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 632 KB
Volume: 237
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(90)90509-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effect of Different Electron Elastic-Sca

Effect of Different Electron Elastic-Scattering Cross Sections on Inelastic Mean Free Paths Obtained from Elastic-Backscattering Experiments

✍ Jablonskiz, Aleksander ;Salvatz, Francesc ;Powellz, Cedric J. 📂 Article 📅 2004 🏛 Springer-Verlag ⚖ 134 KB

Determination of relative electron inela

Determination of relative electron inelastic mean free paths (escape depths) and photoionisation cross-sections by X-ray photoelectron spectroscopy

✍ Cadman, Philip; Evans, Stephen; Scott, John D.; Thomas, John M. 📂 Article 📅 1975 🏛 The Royal Society of Chemistry ⚖ 689 KB

Elastic backscattering of electrons from

Elastic backscattering of electrons from polycrystalline tungsten and determination of electron inelastic mean free path

✍ Gołek, F. ;Doliński, W. 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 196 KB

Derivation of the electron inelastic mea

Derivation of the electron inelastic mean free path from the elastic peak intensity

✍ Jablonski, A; Lesiak, B; Gergely, G 📂 Article 📅 1989 🏛 Royal Swedish Academy of Sciences 🌐 English ⚖ 311 KB

Relative intensities in X-ray photoelect

Relative intensities in X-ray photoelectron spectra. Part IX. Estimates for photoelectron mean free paths taking into account elastic collisions in a solid

✍ O.A. Baschenko; V.I. Nefedov 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 607 KB

Surface photoemission from Si(100) and i

Surface photoemission from Si(100) and inelastic electron mean-free-path in silicon

✍ T.-W Pi; I.-H Hong; C.-P Cheng; G.K Wertheim 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 954 KB

Core-level photoemission spectra of the buckled Si(100)231 surface taken at various energies and emission angles are used to determine the inelastic mean-free-path (IMFP) in silicon. The resultant values fall somewhat below an extrapolation to smaller energy of the empirical formulation of Tanuma, P