Determination of relative electron inelastic mean free paths (escape depths) and photoionisation cross-sections by X-ray photoelectron spectroscopy

✍ Scribed by Cadman, Philip; Evans, Stephen; Scott, John D.; Thomas, John M.

• Book ID: 111985347
• Publisher: The Royal Society of Chemistry
• Year: 1975
• Weight: 689 KB
• Volume: 71
• Category: Article
• ISSN: 0300-9238
• DOI: 10.1039/f29757101777