Determination of yield ratios of elastic
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D. Varga; L. Kövér; J. Tóth; K. Tökési; B. Lesiak; Jablonski; C. Robert; B. Gruz
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Article
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2000
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John Wiley and Sons
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English
⚖ 83 KB
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Intensity ratios of electrons backscattered elastically from thick, amorphous Si, polycrystalline Ag and Au, as well as various (vacuum evaporated, electrodeposited layers and metallic sheets) polycrystalline Ni samples, were measured using high energy resolution and two different experimental geome