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Efficient global strategy for designing and testing scanned sequential circuits

✍ Scribed by Liu, B.-D.; Chen, P.-C.; Nang, J.-F.

Book ID: 114448175
Publisher: The Institution of Electrical Engineers
Year: 1995
Tongue: English
Weight: 690 KB
Volume: 142
Category: Article
ISSN: 1350-2387
DOI: 10.1049/ip-cdt:19951647

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