[IEEE Comput. Soc. Press [1992] 29th ACM/IEEE Design Automation Conference - Anaheim, CA, USA (8-12 June 1992)] [1992] Proceedings 29th ACM/IEEE Design Automation Conference - Delay fault models and test generation for random logic sequential circuits

✍ Scribed by Chakraborty, T.J.; Agrawal, V.D.; Bushnell, M.L.

• Book ID: 118167780
• Publisher: IEEE Comput. Soc. Press
• Year: 1992
• Weight: 817 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780818628221
• DOI: 10.1109/dac.1992.227842