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Efficient Algorithms for Testing Semiconductor Random-Access Memories

✍ Scribed by Nair, R.; Thatte, S.M.; Abraham, J.A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

An Algorithm for Testing Random Access M

✍ Knaizuk, J., Jr.; Hartmann, C.R.P. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 537 KB

VLSI semiconductor random access memory

✍ Venkatapathi Naidu Rayapati 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 774 KB

A built-in test for functional testing i

✍ Yukiya Miura; Hideo Tamamoto; Yuichi Narita 📂 Article 📅 1987 🏛 John Wiley and Sons 🌐 English ⚖ 706 KB

On-chip testing of random access memorie

✍ Kewal K. Saluja 📂 Article 📅 1994 🏛 Springer US 🌐 English ⚖ 813 KB

Built—in concurrent testing for semicond

✍ Yukiya Miura; Hideo Tamamoto; Yuichi Narita 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 842 KB

An Optimal Algorithm for Testing Stuck-a

✍ Knaizuk, J., Jr.; Hartmann, C.R.P. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 780 KB