Built—in concurrent testing for semiconductor random access memories by concurrently testing cells on a word-line

✍ Scribed by Yukiya Miura; Hideo Tamamoto; Yuichi Narita

• Book ID: 112205756
• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 842 KB
• Volume: 19
• Category: Article
• ISSN: 0882-1666
• DOI: 10.1002/scj.4690190605