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Effects of wave function penetration into the gate-oxide on self-consistent modeling of scaled MOSFETs

✍ Scribed by Kauser, M.Z.; Sayed Hasan, M.; Haque, A.


Book ID
114539054
Publisher
IEEE
Year
2002
Tongue
English
Weight
220 KB
Volume
49
Category
Article
ISSN
0018-9383

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