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Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped silicon nanocrystal thin films

✍ Scribed by Huang, Junjun; Zeng, Yuheng; Tan, Ruiqin; Wang, Weiyan; Yang, Ye; Dai, Ning; Song, Weijie

Book ID: 120434591
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 592 KB
Volume: 270
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2013.01.042

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