Growth of In0.52Al0.48As on InP substrat
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S.F. Yoon
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Article
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1998
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Elsevier Science
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English
β 126 KB
Growth of In 0.52 Al 0.48 As epitaxial layers on InP(100) substrates by molecular beam epitaxy at a wide range of arsenic overpressure (V/III flux ratio from 30 to 300) is carried out. Analysis performed using low-temperature photoluminescence (PL) and double-axis X-ray diffraction (XRD) showed a st