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Effects of shielded-gate structure on on-resistance of the SIT with a high-purity channel region

โœ Scribed by Yano, K.; Kim, C.-W.; Kimura, M.; Tanaka, A.; Motoyama, S.-I.; Sukegawa, T.


Book ID
114534614
Publisher
IEEE
Year
1992
Tongue
English
Weight
425 KB
Volume
39
Category
Article
ISSN
0018-9383

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