Effects of Post Dielectric Deposition and Post Metallization Annealing Processes on Metal/Dy 2 O 3 /Si(100) Diode Characteristics

✍ Scribed by Ohmi, Shun-ichiro; Yamamoto, Hiroyuki; Taguchi, Junichi; Tsutsui, Kazuo; Iwai, Hiroshi

• Book ID: 127288945
• Publisher: Institute of Pure and Applied Physics
• Year: 2004
• Tongue: English
• Weight: 361 KB
• Volume: 43
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/jjap.43.1873