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Effects of low-temperature-buffer, rf-power, and annealing on structural and optical properties of ZnO/Al[sub 2]O[sub 3](0001) thin films grown by rf-magnetron sputtering

✍ Scribed by Liu, H. F.; Chua, S. J.

Book ID: 121707994
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 905 KB
Volume: 106
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3176497

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