𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Effects of ionizing radiation on short-channel thin-Oxide (200-Å) MOSFET's

✍ Scribed by Share, S.; Martin, R.A.

Book ID
114591889
Publisher
IEEE
Year
1975
Tongue
English
Weight
233 KB
Volume
22
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Experimental study on isolation edge eff
Experimental study on isolation edge effects in the short channel characteristics of metal oxide semiconductor field effect transistors (MOSFETs)
✍ Toshiyuki Oishi; Katsuomi Shiozawa; Akihiko Furukawa; Yuji Abe; Yasunori Tokuda; 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 265 KB

We investigate experimentally the isolation edge shape effects on the short channel characteristics, i.e. the gate length dependence, of metal oxide semiconductor field effect transistors (MOSFETs) for various isolation structures, as compared with a reference MOSFET without influence of the isolati