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Effects of high-temperature annealing on defects and impurities in As-grown semi-insulating 4H SiC

โœ Scribed by D. Alvarez; V. V. Konovalov; M. E. Zvanut


Book ID
107453040
Publisher
Springer US
Year
2003
Tongue
English
Weight
86 KB
Volume
32
Category
Article
ISSN
0361-5235

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