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Effects of gamma-ray irradiation on thin-gate-oxide VDMOSFET characteristics

✍ Scribed by Sakai, T.; Yachi, T.

Book ID: 114537976
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 501 KB
Volume: 38
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.81647

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