✦ LIBER ✦
Characterization of leakage current in thin gate oxide subjected to 10 keV X-ray irradiation
✍ Scribed by Ling, C.H.; Ang, C.H.; Ang, D.S.
- Book ID
- 114538073
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 96 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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