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Effects of exchange-correlation and surface strain on the subband separations in Si(111) surface inversion layers

✍ Scribed by K.S. Yi; J.J. Quinn

Publisher: Elsevier Science
Year: 1982
Weight: 47 KB
Volume: 113
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(82)90439-x

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