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Effects of electrochemical attack on GaAs (100) surfaces

✍ Scribed by Somogyi, K.


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
309 KB
Volume
195
Category
Article
ISSN
0031-8965

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## In situ atomic force microscopy (AFM) was used to observe the surface structure change during electrodeposition of Cu on p-GaAs(100) surface in HCI solution. How the electrodeposition of Cu proceeded was strongly dependent on the structure of the substrate. In the portion where the surface was