Effects of contact resistance on the evaluation of charge carrier mobilities and transport parameters in amorphous zinc tin oxide thin-film transistors

✍ Scribed by Schulz, Leander; Yun, Eui-Jung; Dodabalapur, Ananth

• Book ID: 125345031
• Publisher: Springer
• Year: 2014
• Tongue: English
• Weight: 600 KB
• Volume: 115
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-014-8422-3