✦ LIBER ✦

The effect of metallization contact resistance on the measurement of the field effect mobility of long-channel unannealed amorphous In–Zn–O thin film transistors

✍ Scribed by Sunghwan Lee; Hongsik Park; David C. Paine

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Enhancement of Interconnectivity in the

✍ H. S. Lee; D. H. Kim; J. H. Cho; Y. D. Park; J. S. Kim; K. Cho 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 433 KB 👁 2 views

High field effect mobility deuterated am

✍ Jiun-lin Yeh; Si-chen Lee 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 136 KB

Effects of contact resistance on the eva

✍ Schulz, Leander; Yun, Eui-Jung; Dodabalapur, Ananth 📂 Article 📅 2014 🏛 Springer 🌐 English ⚖ 600 KB

Effect of Mesoscale Crystalline Structur

✍ H. Yang; T. J. Shin; L. Yang; K. Cho; C. Y. Ryu; Z. Bao 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 519 KB

The effect of various solvents on the ba

✍ Kim, Si Joon; Jung, Joohye; Yoon, Doo Hyun; Kim, Hyun Jae 📂 Article 📅 2012 🏛 Institute of Physics 🌐 English ⚖ 907 KB

Effects of the solvent polarity of a pol

✍ Kim, Hyeok; Bae, Jin-Hyuk; Horowitz, Gilles; Kim, Woo Young; Choi, Yoonseuk 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 646 KB