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Effects of contact resistance on electrical conductivity measurements of SiC-based materials

✍ Scribed by Youngblood, G.E.; Thomsen, E.C.; Henager, C.H.


Book ID
122360296
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
643 KB
Volume
442
Category
Article
ISSN
0022-3115

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