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Effects of carrier-velocity saturation on the characteristics of short channel MOSFETs with lightly doped drains

โœ Scribed by Lee, M. B. ;Lee, J. I. ;Kang, K. N. ;Yoon, K. S. ;Hong, S. ;Lim, K. Y.


Publisher
John Wiley and Sons
Year
1992
Tongue
English
Weight
203 KB
Volume
131
Category
Article
ISSN
0031-8965

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Experimental study on isolation edge eff
โœ Toshiyuki Oishi; Katsuomi Shiozawa; Akihiko Furukawa; Yuji Abe; Yasunori Tokuda; ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 265 KB

We investigate experimentally the isolation edge shape effects on the short channel characteristics, i.e. the gate length dependence, of metal oxide semiconductor field effect transistors (MOSFETs) for various isolation structures, as compared with a reference MOSFET without influence of the isolati