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Effects of annealing on structural and electrical properties of sub-micron thick CIGS films

✍ Scribed by Ko, Byoung Soo (author);Sung, Shi Joon (author);Kim, Dae Hwan (author);Lee, Dong Ha (author);Hwang, Dae Kue (author)

Book ID: 120339218
Publisher: Elsevier B.V.
Year: 2013
Tongue: English
Weight: 686 KB
Volume: 13
Category: Article
ISSN: 1567-1739
DOI: 10.1016/j.cap.2013.01.022

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