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Effects of annealing and current stressing on the intermetallic compounds growth kinetics of Cu/thin Sn/Cu bump

โœ Scribed by Myeong-Hyeok Jeong; Jae-Won Kim; Byung-Hyun Kwak; Young-Bae Park


Book ID
113797789
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
757 KB
Volume
89
Category
Article
ISSN
0167-9317

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