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The effect of intermetallic compound morphology on Cu diffusion in Sn-Ag and Sn-Pb solder bump on the Ni/Cu Under-bump metallization

โœ Scribed by Guh-Yaw Jang; Jenq-Gong Duh


Publisher
Springer US
Year
2005
Tongue
English
Weight
595 KB
Volume
34
Category
Article
ISSN
0361-5235

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