𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Effective object planes for aberration-corrected transmission electron microscopy

✍ Scribed by R. Yu; M. Lentzen; J. Zhu


Book ID
113940567
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
1013 KB
Volume
112
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Practical spatial resolution of electron
✍ A.B. Shah; Q.M. Ramasse; J.G. Wen; A. Bhattacharya; J.M. Zuo πŸ“‚ Article πŸ“… 2011 πŸ› Elsevier Science 🌐 English βš– 778 KB

The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolu

Advances in atomic resolution in situ en
✍ Pratibha L. Gai; Edward D. Boyes πŸ“‚ Article πŸ“… 2009 πŸ› John Wiley and Sons 🌐 English βš– 868 KB

## Abstract Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas‐solid reactions, including at very high temperatures (∼2000Β°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using