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Effect of γ-radiation on HfO2 based MOS capacitor

✍ Scribed by F. Belgin Ergin; Raşit Turan; Sergiu T. Shishiyanu; Ercan Yilmaz

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 348 KB
Volume: 268
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2010.01.027

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