Radiation effects on thin-oxide MOS capacitors caused by electron beam evaporation of aluminum

✍ Scribed by M. Hamasaki

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 410 KB
• Volume: 26
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(83)90127-2