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Effect of thermal fluctuations on the stability of draining thin films

✍ Scribed by Tsekov, Roumen; Ruckenstein, Eli

Book ID: 126394163
Publisher: American Chemical Society
Year: 1993
Tongue: English
Weight: 657 KB
Volume: 9
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la00035a082

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