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Effect of the growth temperature on the RHEED pattern of thin Ge layers on Si(001)−2 × 1 surface

✍ Scribed by C. Tatsuyama; T. Terasaki; H. Obata; T. Tanbo; H. Ueba

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 449 KB
Volume: 115
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(91)90722-h

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