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Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

✍ Scribed by Tikhonravov, Alexander V. ;Trubetskov, Michael K. ;Kokarev, Michael A. ;Amotchkina, Tatiana V. ;Duparré, Angela ;Quesnel, Etienne ;Ristau, Detlev ;Günster, Stefan

Book ID: 115349965
Publisher: The Optical Society
Year: 2002
Tongue: English
Weight: 119 KB
Volume: 41
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.41.002555

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