A novel determination method of thin film optical parameters with least dependence on photometric measurement systematic errors

✍ Scribed by Suyong Wu; Xingwu Long; Kaiyong Yang; Zhongqi Tan

• Book ID: 113831845
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 297 KB
• Volume: 44
• Category: Article
• ISSN: 0030-3992
• DOI: 10.1016/j.optlastec.2011.11.031