Barrier inhomogeneities and electrical c
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PΓ©rez, R. ;Mestres, N. ;Montserrat, J. ;Tournier, D. ;Godignon, P.
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Article
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2005
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John Wiley and Sons
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English
β 127 KB
## Abstract The analysis of βnonidealβ behaviour in currentβvoltage characteristics of fabricated Schottky diodes on 4HβSiC is carried out. An accurate theoretical modelling of the effect of the presence of inhomogeneities on the electron transport across the metalβsemiconductor interface is applie